Selective Plane Illumination microscopy


This plugin combines the idea of using fiduciary markers, local descriptors and geometric hashing and applies global optimization. It can register an arbitrary number of partially overlapping point clouds. It is robust with respect to the amount of incorporated beads, bead distribution, amount of overlap, and can reliably detect non-affine disturbances (e.g. abrupt agarose movement) that might occur during imaging.

For details about the SPIM registration, fusion & deconvolution please have a look at theĀ Multiview Reconstruction Plugin. It is much more powerful, flexible and completely integrated with theĀ BigDataViewer.

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